| Form of presentation | Conference proceedings in Russian journals and collections |
| Year of publication | 2016 |
| Язык | английский |
|
Mosin Sergey Gennadevich, author
|
| Bibliographic description in the original language |
Mosin, S. G. Generating the test program for mixed-signal integrated circuits using the automata network // Problemy razrabotki perspektivnykh mikro- i nanoelektronnykh sistem - 2016. Sbornik trudov / pod obshh. red. akademika RAN A.L. Stempkovskogo. M.: IPPM RAN, 2016. Chast II. S. 36-37. |
| Annotation |
Проблемы разработки перспективных микро- и наноэлектронных систем - 2016. Сборник трудов / под общ. ред. академика РАН А.Л. Стемпковского. Часть II |
| Keywords |
design automation, design-for-testability, test program, mixed-signal integrated circuit, automata network |
| The name of the journal |
Проблемы разработки перспективных микро- и наноэлектронных систем - 2016. Сборник трудов / под общ. ред. академика РАН А.Л. Стемпковского. Часть II
|
| Please use this ID to quote from or refer to the card |
https://repository.kpfu.ru/eng/?p_id=140286&p_lang=2 |
| Resource files | |
|
|
Full metadata record  |
| Field DC |
Value |
Language |
| dc.contributor.author |
Mosin Sergey Gennadevich |
ru_RU |
| dc.date.accessioned |
2016-01-01T00:00:00Z |
ru_RU |
| dc.date.available |
2016-01-01T00:00:00Z |
ru_RU |
| dc.date.issued |
2016 |
ru_RU |
| dc.identifier.citation |
Мосин, С. Г. Generating the test program for mixed-signal integrated circuits using the automata network // Проблемы разработки перспективных микро- и наноэлектронных систем - 2016. Сборник трудов / под общ. ред. академика РАН А.Л. Стемпковского. М.: ИППМ РАН, 2016. Часть II. С. 36-37. |
ru_RU |
| dc.identifier.uri |
https://repository.kpfu.ru/eng/?p_id=140286&p_lang=2 |
ru_RU |
| dc.description.abstract |
Проблемы разработки перспективных микро- и наноэлектронных систем - 2016. Сборник трудов / под общ. ред. академика РАН А.Л. Стемпковского. Часть II |
ru_RU |
| dc.description.abstract |
An efficient generation of test programs ensuring comprehensive testing and diagnosis of MSIC, effective utilization of automated test equipment, reduction of time and money costs on test preparation and execution, etc. is one of the challenges in the area of mixed-signal testing.
The method of test program generation in the form of automata network providing the test execution with various resolving ability for MSIC using the automated test equipment is proposed.
Two basic models for description the test process of MSIC in respect to hierarchical testing are proposed.
Experimental results have confirmed the efficiency of proposed method for generating the test program for hierarchical testing MSIC on automated test equipment. |
ru_RU |
| dc.language.iso |
ru |
ru_RU |
| dc.subject |
design automation |
ru_RU |
| dc.subject |
design-for-testability |
ru_RU |
| dc.subject |
test program |
ru_RU |
| dc.subject |
mixed-signal integrated circuit |
ru_RU |
| dc.subject |
automata network |
ru_RU |
| dc.title |
Generating the test program for mixed-signal integrated circuits using the automata network |
ru_RU |
| dc.type |
Conference proceedings in Russian journals and collections |
ru_RU |
|
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