| Form of presentation | Articles in international journals and collections |
| Year of publication | 2024 |
| Язык | английский |
|
Voynash Sergey Aleksandrovich, author
Zagidullin Ramil Ravilevich, author
Sabitov Linar Salikhzanovich, author
|
| Bibliographic description in the original language |
Malikov, V.N., Ishkov, A.V., Voinash, S.A., Zagidullin, R.R., Sabitov, L.S., Vornacheva, I.V., Ivanov, A.A. AUTOMATED CONTROL OF THE THIN FILMS ELECTRICAL CONDUCTIVITY BY THE EDDY CURRENT METHOD//Eurasian Physical Technical Journal. - 2024. - Vol.21, Is.1. - P.74-83. |
| Keywords |
eddy current transducer, electrical conductivity,thin films, copper, non-destructive testing. |
| The name of the journal |
Eurasian Physical Technical Journal
|
| URL |
https://www.scopus.com/inward/record.uri?eid=2-s2.0-85191247112&doi=10.31489%2f2024no1%2f74-83&partnerID=40&md5=0d409bd75cf38a9628c5edfd4369b725 |
| Please use this ID to quote from or refer to the card |
https://repository.kpfu.ru/eng/?p_id=300347&p_lang=2 |
Full metadata record  |
| Field DC |
Value |
Language |
| dc.contributor.author |
Voynash Sergey Aleksandrovich |
ru_RU |
| dc.contributor.author |
Zagidullin Ramil Ravilevich |
ru_RU |
| dc.contributor.author |
Sabitov Linar Salikhzanovich |
ru_RU |
| dc.date.accessioned |
2024-01-01T00:00:00Z |
ru_RU |
| dc.date.available |
2024-01-01T00:00:00Z |
ru_RU |
| dc.date.issued |
2024 |
ru_RU |
| dc.identifier.citation |
Malikov, V.N., Ishkov, A.V., Voinash, S.A., Zagidullin, R.R., Sabitov, L.S., Vornacheva, I.V., Ivanov, A.A. AUTOMATED CONTROL OF THE THIN FILMS ELECTRICAL CONDUCTIVITY BY THE EDDY CURRENT METHOD//Eurasian Physical Technical Journal. - 2024. - Vol.21, Is.1. - P.74-83. |
ru_RU |
| dc.identifier.uri |
https://repository.kpfu.ru/eng/?p_id=300347&p_lang=2 |
ru_RU |
| dc.description.abstract |
Eurasian Physical Technical Journal |
ru_RU |
| dc.language.iso |
ru |
ru_RU |
| dc.subject |
eddy current transducer |
ru_RU |
| dc.subject |
electrical conductivity |
ru_RU |
| dc.subject |
thin films |
ru_RU |
| dc.subject |
copper |
ru_RU |
| dc.subject |
non-destructive testing. |
ru_RU |
| dc.title |
AUTOMATED CONTROL OF THE THIN FILMS ELECTRICAL CONDUCTIVITY BY THE EDDY CURRENT METHOD |
ru_RU |
| dc.type |
Articles in international journals and collections |
ru_RU |
|