KFU. Card publication. Probing Wave Functions of Electrically Active Shallow Level Defects by Means of High-Frequency Pulsed ENDOR in Wide Bandgap Materials: SiC, AlN, ZnO, and AgCl

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PROBING WAVE FUNCTIONS OF ELECTRICALLY ACTIVE SHALLOW LEVEL DEFECTS BY MEANS OF HIGH-FREQUENCY PULSED ENDOR IN WIDE BANDGAP MATERIALS: SIC, ALN, ZNO, AND AGCL

Form of presentation

Articles in international journals and collections

Year of publication

2021

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Authors, employees of KFU

Mamin Georgiy Vladimirovich, author

Soltamov Viktor Andreevich, author

Bibliographic description in the original language

Orlinskii S.B, Soltamov V.A, Mamin G.V, Probing Wave Functions of Electrically Active Shallow Level Defects by Means of High-Frequency Pulsed ENDOR in Wide Bandgap Materials: SiC, AlN, ZnO, and AgCl//Applied Magnetic Resonance. - 2021. - Vol., Is.. - .

Keywords

EPR

The name of the journal

Applied Magnetic Resonance

URL

https://www.scopus.com/inward/record.uri?eid=2-s2.0-85112473360&doi=10.1007%2fs00723-021-01407-1&partnerID=40&md5=dc9238bda68f361850f42fa7340a4091

Please use this ID to quote from or refer to the card

https://repository.kpfu.ru/eng/?p_id=258223&p_lang=2

Full metadata record

Field DC	Value	Language
dc.contributor.author	Mamin Georgiy Vladimirovich	ru_RU
dc.contributor.author	Soltamov Viktor Andreevich	ru_RU
dc.date.accessioned	2021-01-01T00:00:00Z	ru_RU
dc.date.available	2021-01-01T00:00:00Z	ru_RU
dc.date.issued	2021	ru_RU
dc.identifier.citation	Orlinskii S.B, Soltamov V.A, Mamin G.V, Probing Wave Functions of Electrically Active Shallow Level Defects by Means of High-Frequency Pulsed ENDOR in Wide Bandgap Materials: SiC, AlN, ZnO, and AgCl//Applied Magnetic Resonance. - 2021. - Vol., Is.. - .	ru_RU
dc.identifier.uri	https://repository.kpfu.ru/eng/?p_id=258223&p_lang=2	ru_RU
dc.description.abstract	Applied Magnetic Resonance	ru_RU
dc.language.iso	ru	ru_RU
dc.subject		ru_RU
dc.title	Probing Wave Functions of Electrically Active Shallow Level Defects by Means of High-Frequency Pulsed ENDOR in Wide Bandgap Materials: SiC, AlN, ZnO, and AgCl	ru_RU
dc.type	Articles in international journals and collections	ru_RU