KFU. Card publication. OPTIMIZATION OF CONSTRUCTING THE NEUROMORPHIC FAULT DICTIONARY FOR TESTING AND DIAGNOSTICS OF ANALOG ICs

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FEDERAL UNIVERSITY

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OPTIMIZATION OF CONSTRUCTING THE NEUROMORPHIC FAULT DICTIONARY FOR TESTING AND DIAGNOSTICS OF ANALOG ICS

Form of presentation

Articles in international journals and collections

Year of publication

2019

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Authors, employees of KFU

Mosin Sergey Gennadevich, author

Bibliographic description in the original language

Mosin S. G., OPTIMIZATION OF CONSTRUCTING THE NEUROMORPHIC FAULT DICTIONARY FOR TESTING AND DIAGNOSTICS OF ANALOG ICs//VESTNIK TOMSKOGO GOSUDARSTVENNOGO UNIVERSITETA-UPRAVLENIE VYCHISLITELNAJA TEHNIKA I INFORMATIKA-TOMSK STATE UNIVERSITY JOURNAL OF CONTROL AND COMPUTER SCIENCE. - 2019. - Vol., Is.48. - P.103-111.

Keywords

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The name of the journal

VESTNIK TOMSKOGO GOSUDARSTVENNOGO UNIVERSITETA-UPRAVLENIE VYCHISLITELNAJA TEHNIKA I INFORMATIKA-TOMSK STATE UNIVERSITY JOURNAL OF CONTROL AND COMPUTER SCIENCE

Please use this ID to quote from or refer to the card

https://repository.kpfu.ru/eng/?p_id=212961&p_lang=2

Full metadata record

Field DC	Value	Language
dc.contributor.author	Mosin Sergey Gennadevich	ru_RU
dc.date.accessioned	2019-01-01T00:00:00Z	ru_RU
dc.date.available	2019-01-01T00:00:00Z	ru_RU
dc.date.issued	2019	ru_RU
dc.identifier.citation	Mosin S. G., OPTIMIZATION OF CONSTRUCTING THE NEUROMORPHIC FAULT DICTIONARY FOR TESTING AND DIAGNOSTICS OF ANALOG ICs//VESTNIK TOMSKOGO GOSUDARSTVENNOGO UNIVERSITETA-UPRAVLENIE VYCHISLITELNAJA TEHNIKA I INFORMATIKA-TOMSK STATE UNIVERSITY JOURNAL OF CONTROL AND COMPUTER SCIENCE. - 2019. - Vol., Is.48. - P.103-111.	ru_RU
dc.identifier.uri	https://repository.kpfu.ru/eng/?p_id=212961&p_lang=2	ru_RU
dc.description.abstract	VESTNIK TOMSKOGO GOSUDARSTVENNOGO UNIVERSITETA-UPRAVLENIE VYCHISLITELNAJA TEHNIKA I INFORMATIKA-TOMSK STATE UNIVERSITY JOURNAL OF CONTROL AND COMPUTER SCIENCE	ru_RU
dc.language.iso	ru	ru_RU
dc.subject		ru_RU
dc.title	OPTIMIZATION OF CONSTRUCTING THE NEUROMORPHIC FAULT DICTIONARY FOR TESTING AND DIAGNOSTICS OF ANALOG ICs	ru_RU
dc.type	Articles in international journals and collections	ru_RU