KFU. Card publication. Microscopic Examination of the Silicon Surface Subjected to High-Dose Silver Implantation

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FEDERAL UNIVERSITY

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MICROSCOPIC EXAMINATION OF THE SILICON SURFACE SUBJECTED TO HIGH-DOSE SILVER IMPLANTATION

Form of presentation

Articles in international journals and collections

Year of publication

2019

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Authors, employees of KFU

Osin Yuriy Nikolaevich, author

Rogov Aleksey Mikhaylovich, author

Bibliographic description in the original language

Vorobev V.V, Rogov A.M, Osin Y.N, Microscopic Examination of the Silicon Surface Subjected to High-Dose Silver Implantation//Technical Physics. - 2019. - Vol.64, Is.2. - P.195-202.

Keywords

Silicon Surface, Silver Implantation, Implantation

The name of the journal

Technical Physics

URL

https://www.scopus.com/inward/record.uri?eid=2-s2.0-85065414202&doi=10.1134%2fS1063784219020270&partnerID=40&md5=e8ba2f1c0afc1d5f71295deb33b422c1

Please use this ID to quote from or refer to the card

https://repository.kpfu.ru/eng/?p_id=202361&p_lang=2

Full metadata record

Field DC	Value	Language
dc.contributor.author	Osin Yuriy Nikolaevich	ru_RU
dc.contributor.author	Rogov Aleksey Mikhaylovich	ru_RU
dc.date.accessioned	2019-01-01T00:00:00Z	ru_RU
dc.date.available	2019-01-01T00:00:00Z	ru_RU
dc.date.issued	2019	ru_RU
dc.identifier.citation	Vorobev V.V, Rogov A.M, Osin Y.N, Microscopic Examination of the Silicon Surface Subjected to High-Dose Silver Implantation//Technical Physics. - 2019. - Vol.64, Is.2. - P.195-202.	ru_RU
dc.identifier.uri	https://repository.kpfu.ru/eng/?p_id=202361&p_lang=2	ru_RU
dc.description.abstract	Technical Physics	ru_RU
dc.language.iso	ru	ru_RU
dc.subject	Silicon Surface	ru_RU
dc.subject	Silver Implantation	ru_RU
dc.subject	Implantation	ru_RU
dc.title	Microscopic Examination of the Silicon Surface Subjected to High-Dose Silver Implantation	ru_RU
dc.type	Articles in international journals and collections	ru_RU