KFU. Card publication. Analogue integrated circuits design-for-testability flow oriented onto OBIST strategy

KAZAN
FEDERAL UNIVERSITY

- RUS
- 中文
- ES

ANALOGUE INTEGRATED CIRCUITS DESIGN-FOR-TESTABILITY FLOW ORIENTED ONTO OBIST STRATEGY

Form of presentation

Articles in international journals and collections

Year of publication

2018

��

��

Authors, employees of KFU

Mosin Sergey Gennadevich, author

Bibliographic description in the original language

Mosin S., Analogue integrated circuits design-for-testability flow oriented onto OBIST strategy//Information Technology and Control. - 2018. - Vol.47, Is.3. - P.521-531.

Annotation

Application of built-in self-test circuitries allows to improve the testing quality and reliability of complex analog and mixed-signal IC. BIST-circuitry is integrated to original circuit for the purpose of test signal generation, measurement of output responses and decision-making about correctness of circuit under test functioning. The most part of BIST-circuitries for analog and mixed-signal IC uses generators of sine wave or multifrequency wave for test signal generation, but it is not applicable for majority of practical implementations because of crucial increasing the chip area required for in-circuit realization of generator. The built-in self test circuitry for analog and mixed-signal IC based on reconfiguring original circuit in oscillator, which does not need the generator of input test signals, has been proposed. The principles of functioning and main components of the solution have been considered.

Keywords

analog and mixed-signal integrated circuits, built-in self-test (BIST), reconfiguration, oscillator, design-for-testability (DFT)

The name of the journal

Information Technology and Control

URL

https://www.scopus.com/inward/record.uri?eid=2-s2.0-85054153900&doi=10.5755%2fj01.itc.47.3.19753&partnerID=40&md5=c2578931fc1c6ce34574f1e2e104400a

Please use this ID to quote from or refer to the card

https://repository.kpfu.ru/eng/?p_id=188583&p_lang=2

Full metadata record

Field DC	Value	Language
dc.contributor.author	Mosin Sergey Gennadevich	ru_RU
dc.date.accessioned	2018-01-01T00:00:00Z	ru_RU
dc.date.available	2018-01-01T00:00:00Z	ru_RU
dc.date.issued	2018	ru_RU
dc.identifier.citation	Mosin S., Analogue integrated circuits design-for-testability flow oriented onto OBIST strategy//Information Technology and Control. - 2018. - Vol.47, Is.3. - P.521-531.	ru_RU
dc.identifier.uri	https://repository.kpfu.ru/eng/?p_id=188583&p_lang=2	ru_RU
dc.description.abstract	Information Technology and Control	ru_RU
dc.description.abstract	Application of built-in self-test circuitries allows to improve the testing quality and reliability of complex analog and mixed-signal IC. BIST-circuitry is integrated to original circuit for the purpose of test signal generation, measurement of output responses and decision-making about correctness of circuit under test functioning. The most part of BIST-circuitries for analog and mixed-signal IC uses generators of sine wave or multifrequency wave for test signal generation, but it is not applicable for majority of practical implementations because of crucial increasing the chip area required for in-circuit realization of generator. The built-in self test circuitry for analog and mixed-signal IC based on reconfiguring original circuit in oscillator, which does not need the generator of input test signals, has been proposed. The principles of functioning and main components of the solution have been considered.	ru_RU
dc.language.iso	ru	ru_RU
dc.subject	analog and mixed-signal integrated circuits	ru_RU
dc.subject	built-in self-test (BIST)	ru_RU
dc.subject	reconfiguration	ru_RU
dc.subject	oscillator	ru_RU
dc.subject	design-for-testability (DFT)	ru_RU
dc.title	Analogue integrated circuits design-for-testability flow oriented onto OBIST strategy	ru_RU
dc.type	Articles in international journals and collections	ru_RU