KFU. Card publication. Automated simulation of faults in analog circuits based on parallel paradigm

KAZAN
FEDERAL UNIVERSITY

- RUS
- 中文
- ES

AUTOMATED SIMULATION OF FAULTS IN ANALOG CIRCUITS BASED ON PARALLEL PARADIGM

Form of presentation

Articles in international journals and collections

Year of publication

2017

Язык

английский

Authors, employees of KFU

Mosin Sergey Gennadevich, author

Bibliographic description in the original language

Mosin S., Automated simulation of faults in analog circuits based on parallel paradigm//Proceedings of 2017 IEEE East-West Design and Test Symposium, EWDTS 2017. - 2017. - Vol., Is.. - Art. № 8110133.

Keywords

analog circuits, design automation, design-for-testability, fault simulation, Monte Carlo method, parallel paradigm

The name of the journal

Proceedings of 2017 IEEE East-West Design and Test Symposium, EWDTS 2017

URL

https://www.scopus.com/inward/record.uri?eid=2-s2.0-85040530367&doi=10.1109%2fEWDTS.2017.8110133&partnerID=40&md5=6866b6c97a1e59f9f3ddff61f62c5dd5

Please use this ID to quote from or refer to the card

https://repository.kpfu.ru/eng/?p_id=173364&p_lang=2

Full metadata record

Field DC	Value	Language
dc.contributor.author	Mosin Sergey Gennadevich	ru_RU
dc.date.accessioned	2017-01-01T00:00:00Z	ru_RU
dc.date.available	2017-01-01T00:00:00Z	ru_RU
dc.date.issued	2017	ru_RU
dc.identifier.citation	Mosin S., Automated simulation of faults in analog circuits based on parallel paradigm//Proceedings of 2017 IEEE East-West Design and Test Symposium, EWDTS 2017. - 2017. - Vol., Is.. - Art. № 8110133.	ru_RU
dc.identifier.uri	https://repository.kpfu.ru/eng/?p_id=173364&p_lang=2	ru_RU
dc.description.abstract	Proceedings of 2017 IEEE East-West Design and Test Symposium, EWDTS 2017	ru_RU
dc.language.iso	ru	ru_RU
dc.subject	analog circuits	ru_RU
dc.subject	design automation	ru_RU
dc.subject	design-for-testability	ru_RU
dc.subject	fault simulation	ru_RU
dc.subject	Monte Carlo method	ru_RU
dc.subject	parallel paradigm	ru_RU
dc.title	Automated simulation of faults in analog circuits based on parallel paradigm	ru_RU
dc.type	Articles in international journals and collections	ru_RU