KFU. Card publication. An approach to design-for-testability automation of analogue integrated circuits using OBIST strategy

KAZAN
FEDERAL UNIVERSITY

- RUS
- 中文
- ES

AN APPROACH TO DESIGN-FOR-TESTABILITY AUTOMATION OF ANALOGUE INTEGRATED CIRCUITS USING OBIST STRATEGY

Form of presentation

Articles in international journals and collections

Year of publication

2016

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Authors, employees of KFU

Mosin Sergey Gennadevich, author

Bibliographic description in the original language

Mosin S., An approach to design-for-testability automation of analogue integrated circuits using OBIST strategy//2016 5th Mediterranean Conference on Embedded Computing, MECO 2016 - Including ECyPS 2016, BIOENG.MED 2016, MECO: Student Challenge 2016. - 2016. - Vol., Is.. - P.211-214.

Annotation

The reasons of application OBIST concept for testing analog integrated circuits are given. Design automation of OBIST circuitries is important step for their efficient development. The approach to design automation of OBIST-based test circuitries is presented. The structural solutions for circuit recon-figuration to oscillator are proposed. The criterion of the reconfiguration circuitry selection for OBIST and rules of reconfiguration for proposed structural solutions are described.

Keywords

DFT, OBIST, CAD, analog testing, reconfiguration

The name of the journal

2016 5th Mediterranean Conference on Embedded Computing, MECO 2016 - Including ECyPS 2016, BIOENG.MED 2016, MECO: Student Challenge 2016

URL

https://www.scopus.com/inward/record.uri?eid=2-s2.0-84994102640&partnerID=40&md5=c242688ded62eef4a97ea40c5aeac0d4

Please use this ID to quote from or refer to the card

https://repository.kpfu.ru/eng/?p_id=165138&p_lang=2

Full metadata record

Field DC	Value	Language
dc.contributor.author	Mosin Sergey Gennadevich	ru_RU
dc.date.accessioned	2016-01-01T00:00:00Z	ru_RU
dc.date.available	2016-01-01T00:00:00Z	ru_RU
dc.date.issued	2016	ru_RU
dc.identifier.citation	Mosin S., An approach to design-for-testability automation of analogue integrated circuits using OBIST strategy//2016 5th Mediterranean Conference on Embedded Computing, MECO 2016 - Including ECyPS 2016, BIOENG.MED 2016, MECO: Student Challenge 2016. - 2016. - Vol., Is.. - P.211-214.	ru_RU
dc.identifier.uri	https://repository.kpfu.ru/eng/?p_id=165138&p_lang=2	ru_RU
dc.description.abstract	2016 5th Mediterranean Conference on Embedded Computing, MECO 2016 - Including ECyPS 2016, BIOENG.MED 2016, MECO: Student Challenge 2016	ru_RU
dc.description.abstract	The reasons of application OBIST concept for testing analog integrated circuits are given. Design automation of OBIST circuitries is important step for their efficient development. The approach to design automation of OBIST-based test circuitries is presented. The structural solutions for circuit recon-figuration to oscillator are proposed. The criterion of the reconfiguration circuitry selection for OBIST and rules of reconfiguration for proposed structural solutions are described.	ru_RU
dc.language.iso	ru	ru_RU
dc.subject	DFT	ru_RU
dc.subject	OBIST	ru_RU
dc.subject	CAD	ru_RU
dc.subject	analog testing	ru_RU
dc.subject	reconfiguration	ru_RU
dc.title	An approach to design-for-testability automation of analogue integrated circuits using OBIST strategy	ru_RU
dc.type	Articles in international journals and collections	ru_RU