Form of presentation | Articles in international journals and collections |
Year of publication | 2017 |
Язык | английский |
|
Tumakov Dmitriy Nikolaevich, author
|
Bibliographic description in the original language |
Tumakov D. On uniqueness of a solution to the problem of reconstruction of the homogeneous dielectric layer parameters // Far East Journal of Mathematical Sciences. – 2017. – Vol. 101, No. 4. – P. 763-772. |
Annotation |
Uniqueness of a solution to the problem of reconstruction of the dielectric layer parameters arising during analysis of a scattered field is investigated. The study is concerned with two cases, which include determining refractive index of a dielectric material, filling the layer, and determining thickness of the layer. It is concluded that two measurements, conducted at different and «properly chosen« frequencies, are sufficient to provide uniqueness of a solution to the reconstruction problem. |
Keywords |
reconstruction of parameters, uniqueness of solution, dielectric layer, inverse problem |
The name of the journal |
Far East Journal of Mathematical Sciences
|
URL |
http://www.pphmj.com/abstract/10542.htm |
Please use this ID to quote from or refer to the card |
https://repository.kpfu.ru/eng/?p_id=152267&p_lang=2 |
Full metadata record |
Field DC |
Value |
Language |
dc.contributor.author |
Tumakov Dmitriy Nikolaevich |
ru_RU |
dc.date.accessioned |
2017-01-01T00:00:00Z |
ru_RU |
dc.date.available |
2017-01-01T00:00:00Z |
ru_RU |
dc.date.issued |
2017 |
ru_RU |
dc.identifier.citation |
Tumakov D. On uniqueness of a solution to the problem of reconstruction of the homogeneous dielectric layer parameters // Far East Journal of Mathematical Sciences. – 2017. – Vol. 101, No. 4. – P. 763-772. |
ru_RU |
dc.identifier.uri |
https://repository.kpfu.ru/eng/?p_id=152267&p_lang=2 |
ru_RU |
dc.description.abstract |
Far East Journal of Mathematical Sciences |
ru_RU |
dc.description.abstract |
Uniqueness of a solution to the problem of reconstruction of the dielectric layer parameters arising during analysis of a scattered field is investigated. The study is concerned with two cases, which include determining refractive index of a dielectric material, filling the layer, and determining thickness of the layer. It is concluded that two measurements, conducted at different and «properly chosen« frequencies, are sufficient to provide uniqueness of a solution to the reconstruction problem. |
ru_RU |
dc.language.iso |
ru |
ru_RU |
dc.subject |
reconstruction of parameters |
ru_RU |
dc.subject |
uniqueness of solution |
ru_RU |
dc.subject |
dielectric layer |
ru_RU |
dc.subject |
inverse problem |
ru_RU |
dc.title |
On uniqueness of a solution to the problem of reconstruction of the homogeneous dielectric layer parameters |
ru_RU |
dc.type |
Articles in international journals and collections |
ru_RU |
|