Form of presentation | Articles in international journals and collections |
Year of publication | 2015 |
Язык | английский |
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Orlinskiy Sergey Borisovich, author
Yavkin Boris Vladimirovich, author
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Soltamov, Tolmachev, Babunc, Badalyan, Davydov, Mokhov, Proskuryakov, Baranov Viktor, Daniil, Roman, Andrey, Vladimir, Evgeniy, Ivan, Pavel , author
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Bibliographic description in the original language |
1. Soltamov V. A., Yavkin B. V., Tolmachev D. O., Babunts R. A., Badalyan A. G., Davydov V. Y., Mokhov E. N., Proskuryakov I. I., Orlinskii S. B., Baranov P. G. Optically Addressable Silicon Vacancy-Related Spin Centers in Rhombic Silicon Carbide with High Breakdown Characteristics and ENDOR Evidence of Their Structure // Physical Review Letters. ‒ 2015. ‒ T. 115, № 24. ‒ C. 247602. |
Keywords |
Color centers and other defects, Optically detected magnetic resonance (ODMR), Electron-nuclear double resonance (ENDOR), electron double resonance (ELDOR), Indirect evidence of dislocations and other defects (resistivity, slip, creep, strains, internal friction, EPR, NMR, etc.) |
The name of the journal |
PHYS REV LETT
|
Please use this ID to quote from or refer to the card |
https://repository.kpfu.ru/eng/?p_id=135662&p_lang=2 |
Full metadata record |
Field DC |
Value |
Language |
dc.contributor.author |
Orlinskiy Sergey Borisovich |
ru_RU |
dc.contributor.author |
Yavkin Boris Vladimirovich |
ru_RU |
dc.contributor.author |
Soltamov, Tolmachev, Babunc, Badalyan, Davydov, Mokhov, Proskuryakov, Baranov Viktor, Daniil, Roman, Andrey, Vladimir, Evgeniy, Ivan, Pavel |
ru_RU |
dc.date.accessioned |
2015-01-01T00:00:00Z |
ru_RU |
dc.date.available |
2015-01-01T00:00:00Z |
ru_RU |
dc.date.issued |
2015 |
ru_RU |
dc.identifier.citation |
1. Soltamov V. A., Yavkin B. V., Tolmachev D. O., Babunts R. A., Badalyan A. G., Davydov V. Y., Mokhov E. N., Proskuryakov I. I., Orlinskii S. B., Baranov P. G. Optically Addressable Silicon Vacancy-Related Spin Centers in Rhombic Silicon Carbide with High Breakdown Characteristics and ENDOR Evidence of Their Structure // Physical Review Letters. ‒ 2015. ‒ T. 115, № 24. ‒ C. 247602. |
ru_RU |
dc.identifier.uri |
https://repository.kpfu.ru/eng/?p_id=135662&p_lang=2 |
ru_RU |
dc.description.abstract |
PHYS REV LETT |
ru_RU |
dc.language.iso |
ru |
ru_RU |
dc.subject |
Color centers and other defects |
ru_RU |
dc.subject |
Optically detected magnetic resonance (ODMR) |
ru_RU |
dc.subject |
Electron-nuclear double resonance (ENDOR) |
ru_RU |
dc.subject |
electron double resonance (ELDOR) |
ru_RU |
dc.subject |
Indirect evidence of dislocations and other defects (resistivity |
ru_RU |
dc.subject |
slip |
ru_RU |
dc.subject |
creep |
ru_RU |
dc.subject |
strains |
ru_RU |
dc.subject |
internal friction |
ru_RU |
dc.subject |
EPR |
ru_RU |
dc.subject |
NMR |
ru_RU |
dc.subject |
etc.) |
ru_RU |
dc.title |
Optically Addressable Silicon Vacancy-Related Spin Centers in Rhombic Silicon Carbide with High Breakdown Characteristics and ENDOR Evidence of Their Structure |
ru_RU |
dc.type |
Articles in international journals and collections |
ru_RU |
|