KFU. Card publication. Design-for-testability automation of mixed-signal integrated circuits

KAZAN
FEDERAL UNIVERSITY

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DESIGN-FOR-TESTABILITY AUTOMATION OF MIXED-SIGNAL INTEGRATED CIRCUITS

Form of presentation

Conference proceedings in international journals and collections

Year of publication

2013

Язык

английский

Authors, employees of KFU

Mosin Sergey Gennadevich, author

Bibliographic description in the original language

Mosin S. Design-for-testability automation of mixed-signal integrated circuits / S. Mosin // Proc. IEEE 26th International SOC Conference (SOCC) - Erlangen. Germany. - 2013. - P. 244 - 249.

Annotation

Proc. IEEE 26th International SOC Conference (SOCC)

Keywords

computer-aided design-for-testability, integrated circuit design, mixed-signal integrated circuits, DFT-automation

The name of the journal

Proc. IEEE 26th International SOC Conference (SOCC)

URL

http://dx.doi.org/10.1109/SOCC.2013.6749695

Please use this ID to quote from or refer to the card

https://repository.kpfu.ru/eng/?p_id=126030&p_lang=2

Full metadata record

Field DC	Value	Language
dc.contributor.author	Mosin Sergey Gennadevich	ru_RU
dc.date.accessioned	2013-01-01T00:00:00Z	ru_RU
dc.date.available	2013-01-01T00:00:00Z	ru_RU
dc.date.issued	2013	ru_RU
dc.identifier.citation	Mosin S. Design-for-testability automation of mixed-signal integrated circuits / S. Mosin // Proc. IEEE 26th International SOC Conference (SOCC) - Erlangen. Germany. - 2013. - P. 244 - 249.	ru_RU
dc.identifier.uri	https://repository.kpfu.ru/eng/?p_id=126030&p_lang=2	ru_RU
dc.description.abstract	Proc. IEEE 26th International SOC Conference (SOCC)	ru_RU
dc.description.abstract	The methodology to computer-aided design-for-testability (DFT) of mixed-signal IC is proposed. Functional model of DFT-automation is presented as IDEF0-diagram based on the system analysis. The purpose and principal realization of the key DFT processes in the model are considered. The decision criterions of effective DFT-solution for particular mixed-signal circuit design are proposed. The features of testing circuitries library are descried. Experimental results of the methodology application for analog-digital ADPCM codec are presented.	ru_RU
dc.language.iso	ru	ru_RU
dc.subject	computer-aided design-for-testability	ru_RU
dc.subject	integrated circuit design	ru_RU
dc.subject	mixed-signal integrated circuits	ru_RU
dc.subject	DFT-automation	ru_RU
dc.title	Design-for-testability automation of mixed-signal integrated circuits	ru_RU
dc.type	Conference proceedings in international journals and collections	ru_RU